
自引率: 22.5%
被引量: 8952
通过率: 暂无数据
审稿周期: 暂无数据
版面费用: 暂无数据
国人发稿量: 暂无数据
投稿须知/期刊简介:
Scientists engaged in ultrastructure research seem to fall into two overlapping categories. One group uses existing tools and methods to advance knowledge in particular disciplines. The second group is committed to advancing the tools and methods themselves. For the benefit of both groups, this work finds its outlet in Ultramicroscopy, a journal initiated to provide a forum for investigators and to concentrate otherwise widely dispersed knowledge, promoting cross-fertilization between the two groups. This communication between developer and user covers all aspects - fundamental and technical - pertaining to ultramicroscopic elucidation of structure, ranging from particle optics to radiation interaction.
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Effective removal of global tilt from atomically-resolved topography images of vicinal surfaces with narrow terraces.
被引量:- 发表:1970
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Characterization of strongly coupled quartz tuning fork sensors for precision force measurement in atomic force microscopy.
被引量:- 发表:1970
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Automated detection and mapping of crystal tilt using thermal diffuse scattering in transmission electron microscopy.
被引量:- 发表:1970
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A new method for estimating nanoparticle deposition coverage from a set of weak-contrast SEM images.
被引量:- 发表:1970
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Theoretical study on the effect of temperature gradient on contact-free scanning for scanning ion conductance microscopy.
被引量:- 发表:1970